
ACTIF WAFER
LEVEL TESTER
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FULLY AUTOMATED WAFER LEVEL TESTER
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A new generation that supports multiple-wafer tests with faster scanning and shorter test time, Axis-Tec has developed a Fully Automated Wafer Level Tester with feature-rich capabilities that is mass production ready.
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Axis-Tec's standard Automated Wafer Level Tester actif comes with all the built-in features and has high flexibilities that can be integrated with a wide range of optical electrical test instruments or equipment to execute testing applications of O-O (Optical to Optical, E-O (Electrical to Optical) and O-E (Optical to Electrical). The wafer level tester is designed and built with automated passive and active align to enable precise optical peak search and electrical probing positioning.
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BENEFITS & FEATURES
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High Speed Fiber / Fiber Array Alignment
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<3 seconds for single alignment
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<1dB insertion loss
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Precision Handling System
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Vision alignment in multiple dimensions
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6 Axis of freedom probers
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High Integration Flexibility
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Integrated to various test equipment
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Expandable to any communication protocol
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Low Cost Capital Investments
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Competitive Price offer Shorter ROIs
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