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FULLY AUTOMATED WAFER LEVEL TESTER

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A new generation that supports multiple-wafer tests with faster scanning and shorter test time, Axis-Tec has developed a Fully Automated Wafer Level Tester with feature-rich capabilities that is mass production ready.

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Axis-Tec's standard Automated Wafer Level Tester actif comes with all the built-in features and has high flexibilities that can be integrated with a wide range of optical electrical test instruments or equipment to execute testing applications of O-O (Optical to Optical, E-O (Electrical to Optical) and O-E (Optical to Electrical). The wafer level tester is designed and built with automated passive and active align to enable precise optical peak search and electrical probing positioning.

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BENEFITS & FEATURES

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• High Speed Fiber / Fiber Array Alignment

  • <3 seconds for single alignment

  • <1dB insertion loss

• Precision Handling System

  • Vision alignment in multiple dimensions

  • 6 Axis of freedom probers

• High Integration Flexibility

  • Integrated to various test equipment

  • Expandable to any communication protocol

• Low Cost Capital Investments

  • Competitive Price offer Shorter ROIs